MVTS exclusively owns the rights and intellectual property to the Credence products: Vista, DUO, Quartet, Octet, Kalos, SC and EXA.
MVTS offers refurbished Credence EXA test systems configured to match your requirements. Please contact MVTS with your tester and upgrade requirements. MVTS also offers upgrades, spare parts and consumables for the EXA test systems. Click here for MVTS Credence EXA service and support options. EXA: Introduced in 1992
EXA2000:
100MHz
Analog and digital options; PC peripheral, TV, video, audio, datacom and telecom device test demands.
Higher 400Mbit/s digital data rates and accuracy.
Analog channels for audio/video interface test.
64 Dynamic VI channels for parallel LF analog test and reduced test times.
Multiple, high speed differential analog and digital sources for test of high speed serial interfaces e.g., 100BaseT and Gigabit Ethernet, at up to 1.6Gb/s
DC capabilities for high-power devices and integrated structural test.
Time Interval Analyzer for comprehensive timing characterization of embedded PLLs.
Fully-featured APG for testing embedded memories.
Scan for exercising device BIST.
Designed-in compatibility with existing EXA, SXA, SX100 and SX200 systems.
Integrated liquid cooling for long-term stability and accuracy.
The EXA2000 series' common hardware and software architectures are compatible with EXA, SX and other ITS9000 systems, reducing cost-of-ownership due to lower operating and training expenses, compatible test programs and load-boards, and common spares.
EXA3000:
Functional test platform capable of testing a wide range of ICs.
Wide performance range from 400 MHz to 3.2 GHz, allowing the test of most SOCs, microprocessors and graphics ICs.
Used for characterization and final test.
Flexible and customizable and includes features such as high performance digital instruments, advanced analog instruments, mixed signal synchronization, low electrical noise and a common graphical user interface.
When configured with a high performance test head, the EXA3000 offers up to 1,280 configurable pins for high pin count ICs or for multiple testing of low pin count ICs.
Offer up to +/-75 picoseconds edge-placement accuracy, 800-megabits-per-second data rates and a -120-dB analog noise floor to generate higher product yields when testing high-speed datacom ASICs.
Fitted with over 100 mixed signal test options. These include RF for integrated wireless devices and a broadband analog channel.
