MVTS offers refurbished Teradyne A5xx/A3xx test systems and parts, fully operational with warranty.
A360:
Analog LSI Test System
Developed for standard linear and mixed signal device testing
A585:
Mixed Signal AVLSI Test Systems
Combines digital and analog capabilities with graphics-based software for testing AVLSI mixed signal devices.
Can test mixed signal devices functionally, or test the internal components of the device.
Analog and digital instrumentation and sophisticated high-speed processing and control signals are combined to fully characterize AVLSI devices.
A575:
Mixed Signal AVLSI Test Systems
Combines digital and analog capabilities with graphics-based software for testing AVLSI mixed signal devices.
Can test mixed signal devices functionally, or test the internal components of the device.
Analog and digital instrumentation and sophisticated high-speed processing and control signals are combined to fully characterize AVLSI devices.
A565/A567:
Configured to contain a full complement of instrumentation which includes AC measurement, DC measurement, RF measurement and digital and time measurement modules.
This instrumentation combined with advanced graphics based software allows high volume, high-speed testing for devices such as operational amplifiers, voltage regulators and digital-to-analog converters.
A520/A540:
Analog VLSI Test System
Combines digital and analog capabilities with graphics-based software for the testing of AVLSI mixed-signal devices.
Tests either the functionality of a mixed-signal device or its internal components as desired.
Combines analog and digital instrumentation with high speed processing and control.
A530/A535:
AC measurement, DC measurement, RF measurement, digital and time measurement modules
This instrument allows high volume, high speed testing for devices such as operational amplifiers, voltage regulators and digital-to-analog converters.
Can be used with a maximum of four test heads with parallel testing capability for increased throughput.
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