Intended for:
This course is designed for an Applications Engineer who has the responsibility of writing test programs that must run on Trillium Master Series of testers.
Duration:
Ten (10) days
Prerequisites:
Preferably, the student should have a background in Pascal programming with some Automatic Test Equipment (ATE) experience. Knowledge of testing methodology is considered a plus. However, Pascal programming experience and knowledge of testing methodology are not mandatory.This course was designed for the student that has some ATE experience but not necessarily in the area of LTX Master Series testers.
Course Overview:
Course Materials:
Master Series Applications Course Student Workbook (Vol-1)
Master Series Applications Course Student Workbook (Vol-2)
Master Series Applications Course Lab Workbook
Master Series Applications Course Domain Workstation Tutorial
Course Content
Introduction and Orientation
Student Orientation
Course Objectives and Description
HP - Apollo workstation introduction
Keyboard and related operations
Display manager
Shell and it's basic commands
Editing Files
Custom features
Help
Lab work
Pascal Overview
Menu system -Basic Structure -Log in -Key operations -Special keys -Mouse operations -Menu questions, and rules -The help system -Lab work
The compile process -Compilation sequence -Introduction to the compile menu -Lab work
Menu system -Basic structure -Log in -Key operations -Special keys -Mouse operations -Menu questions, and rules -The help system -Lab work
The compile process -Compilation sequence -Introduction to the compile menu -Lab work
The Trillium Pascal extensions -Constants -Types -Variables -Functions -Procedures -Program sequencing -Pin scrambling -Lab work
Introduction to the tester hardware
Basic models
Physical blocks
Test heads -Load board overview -CBITS and associated language and applications -DPS boards and associated language and applications -Lab work
Analog hardware and software overview -Pin cards and its different types -VI units -VI0 -Pico Ammeter -Testing applications: Static Power Supply, Leakage, and Opens/short tests -Lab work
High speed system
Analog domain -Levels -Low speed functional state testing
Data Domain -Control Pattern Memory -Data Pattern Memory -Waveform Control Memory -Algorithm Pattern Generator
Timing Domain -Micromaster Compatibility Mode -Primary Period -Markers -Sync Clock -Mux Mode -Extended Frequency Mode -Time Set Scrambling Memory
Formats and putting it all together -Drive waveforms -I/O waveforms -Comparator strobing -Low speed modes -Ignoring fails -Supporting tester language and applications: Functional, Level, Frequency, and timing tests -Lab work
Test Setup Menu -Datalog -Summaries -External interfaces
Hardware Status
Interactive
Parameter Edit
Debug
Pattern Debug
Pattern Edit
Logic Waveform
Record Restore
Hands-On tester debug
Test program development and troubleshooting -Pin list and patterns are provided Tests developed by students to include Open/shorts (three methods), Power supply shorts, Input leakage, Functional, Output, Leakage, Levels, Timing, Frequency, and Dynamic, Power Supply current
Using characterization tools -Logic Waveform -Pattern Edit -Shmoos -Pin Margin
